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Yokogawa Products
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Optical Instruments >
AQ6370 Series Overview > |
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| AQ6375 Long Wavelength Optical Spectrum
Analyzer |
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Overview
The High Performance LONG WAVELENGTH AQ6375 is the first bench-top
optical spectrum analyzer covering the long wavelengths over 2
µm. It is designed for researchers and
engineering who have been struggling with inadequate test equipment
to measure in these long wavelength ranges. The AQ6375 achieves high
speed measurements with high accuracy, resolution and sensitivity,
even while providing full analysis features. Troublesome calibration
steps and the development of external analysis software is no longer
required.
The
features of this AQ6375 are indispensable to the research,
development, and manufacturing of optical devices in the wavelength
range from the telecommunications band to 2.4µm.
No other test system can achieve this high performance and
ease of use at the same time.
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AQ6370C Datasheet (PDF)
(documents
are in PDF format and will open in a new window) |
Features
- Long wavelength
measurement capability
(1200nm to 2400nm).
- High wavelength accuracy
and resolution.
- High Sensitivity -20dBm to
-70dBm.
- High speed measurement.
- USB for mouse, keyboard,
and memory.
- Remote operation (GP-IB,
RS-232, Ethernet).
Applications
- Optical fiber
communications.
- Laser and optical device
test for:
Gas sensing in medical and free-space
communications.
- Passive optical devices.
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Long Wavelength 1200 nm to 2400
nm |
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The AQ6375 can
measure optical power as low as -70 dBm, which enables
measurements of low power sources or low power output of
a device under test Measurement sensitivity can be
chosen from seven categories according to test
applications and measurement speed requirements.
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High Sensitivity +20dBm to
-70dBm |
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The AQ6375 can measure optical power as low as
-70dBm, which enables measurements of low power sources
or low power output of a device under test Measurement
sensitivity can be chosen from seven categories
according to test applications and measurement speed
requirements.
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The spectrum of a white light source
(yellow) and the background noise of AQ6375
(red) |
Measured HeNe Laser (1523nm),
Close-in Dynamic range at peak
±0.8nm |
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High Resolution and
Wide Dynamic Range |
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The AQ6375 uses a
double-pass monochromator structure to
achieve high wavelength resolution (0.05nm)
and wide close-in dynamic range (55dB).
Thus, closely allocated signals and noise
can be separately measured. As viewed in the
above example screen shot.
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High speed
Measurement |
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Greater Efficiency
High Speed Sweep
With a proprietary sweep technique the
AQ6375 achieves a much faster sweep speed
than conventional measurement systems which
use a monochromator. Max sweep time is only
0.5sec. in 100nm span.
Fast Command
Processing and Data Transfer
Applying a fast microprocessor, the AQ6375
achieves very fast command processing speed
and Ethernet provides up to 100 times faster
data transfer speed than the GP-IB
Measurement
Examples |
1800nm DFB-LD
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2010nm DFB-LD
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Resolution: 50pm, Span: 10nm
Sensitivity: HIGH1/CHOP
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Resolution: 50pm, Span: 20nm
Sensitivity: HIGH1/CHOP
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Free Space Optical Input |
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Support Multimode
Fiber
Applicable fiber:
SMF and MMF
The AQ6375 uses a free space input
structure, not having an optical fiber
inside the monochromator that can handle
both single mode and multimode fibers. The
free space input is also beneficial for
measurement repeatability. |
Free-Space Optical input structure |
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Built-in Calibrator |
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Easy Calibration
The AQ6375 comes with a built-in calibrator
for wavelength calibration and optical alignment
adjustment of the monochromator in order to maintain
accurate measurements. The calibration and adjustment
are automatically performed and completed within a
couple of minutes.
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Wavelength Calibration |
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Calibrates with the designate absorption line of
Acetylene gas.
Optical Alignment Adjustment
Corrects mechanical movements inside the monochromator
caused by shock and vibration.
Note: the wavelength can also be
calibrated with an external light source. |
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